AEHR Share Price

Open 3.09 Change Price %
High 3.15 1 Day 0.02 0.66
Low 2.67 1 Week 0.10 3.37
Close 3.07 1 Month -0.19 -5.83
Volume 17437 1 Year 1.07 53.50
52 Week High 3.58
52 Week Low 0.00
AEHR Important Levels
Resistance 2 3.51
Resistance 1 3.33
Pivot 2.96
Support 1 2.81
Support 2 2.63
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Aehr Test Systems (NASDAQ: AEHR)

AEHR Technical Analysis 4
As on 2nd Dec 2016 AEHR Share Price closed @ 3.07 and we RECOMMEND Strong Buy for LONG-TERM with Stoploss of 1.86 & Buy for SHORT-TERM with Stoploss of 2.94 we also expect STOCK to react on Following IMPORTANT LEVELS.
AEHR Target for December
1st Target up-side 3.57
2nd Target up-side 3.98
3rd Target up-side 4.39
1st Target down-side 2.41
2nd Target down-side 2
3rd Target down-side 1.59
AEHR Other Details
Segment EQ
Market Capital 8497443.00
Sector Technology
Industry Semiconductor Equipment & Materials
Offical website http://www.aehr.com
AEHR Address
AEHR
400 Kato Terrace
Fremont, CA 94539
United States
Phone: 510-623-9400
Fax: 510-623-9450
Interactive Technical Analysis Chart Aehr Test Systems ( AEHR NASDAQ USA )
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AEHR Business Profile
Aehr Test Systems, incorporated on May 25, 1977, develops, manufactures and sells systems, which is designed to reduce the cost of testing and to perform reliability screening, or burn-in, of complex logic and memory devices. These systems can be used to perform parallel testing and burn-in of packaged integrated circuits (ICs), singulated bare die or ICs still in wafer form. It manufactures and markets full wafer contact test systems, test during burn-in systems, test fixtures, die carriers and related accessories. The Company has developed and introduced several product families, including the ABTSTM and FOXTM systems, the WaferPak cartridge and the DiePak carrier. The new ABTS family of systems can perform test during burn-in of complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip, and offers Individual Temperature Control for high-power advanced logic devices. The WaferPak cartridge includes a full-wafer probe card for use in testing wafers in FOX systems. The FOX-1 full wafer parallel test system is designed for massively parallel test in wafer sort. The FOX-1 system is designed to make electrical contact to and test all of the die on a wafer in a single touchdown. The FOX-1 test head and WaferPak contactor are compatible with industry-standard 300 millimeter wafer probers, which provide the wafer handling and alignment automation for the FOX-1 system.